meta/visit-1.0.0

Visit Information

Outline

Schema Definitions

This type is an object with the following properties:

  • dither

    objectRequired

    Dither Pattern Information

    This type is an object with the following properties:

    • primary_name

      objectRequired

      Primary Dither Pattern Name

      Name of the primary dither pattern used for the visit.

      This node must validate against any of the following:

      • string

        Maximum length: 100

      • null

    • subpixel_name

      objectRequired

      Subpixel Dither Pattern Name

      Name of the subpixel dither pattern used for the visit.

      This node must validate against any of the following:

      • string

        Maximum length: 100

      • null

    • executed_pattern

      objectRequired

      Executed Dither Pattern Offsets (arcsec)

      The combination of the primary and subpixel dither patterns (if selected) in units of arcseconds. If a subpixel dither pattern is selected, then all of the subpixel dither offsets are performed at each of the points in the primary dither pattern. Thus, the total number of dither offsets executed is the product of the number of points in the primary and subpixel dither patterns. The array contains (X, Y) pairs of offsets in the subpixel dither pattern where the X and Y coordinates are defined in the ideal system. The ideal coordinate system is a geomtric-distortion-corrected reference frame projected onto a tangent plane. For more information, see the Science Instrument Aperture File (SIAF) and associated documentation. The exposure identifier in meta.observation.exposure can be used to index this array to obtain the relative pointing offset from the initial target position for this exposure. Note that the exposure identifier is 1-indexed.

      This node must validate against any of the following:

      • array

        No length restriction

        Items in the array are restricted to the following types:

        number

      • null

  • type

    stringRequired

    Visit Type

    The type of visit from observation planning.

    No length restriction

    Only the following values are valid for this node:

    • GENERAL_ENGINEERING

    • GENERIC

    • PARALLEL

    • PRIME_TARGETED_FIXED

    • PRIME_UNTARGETED

  • start_time

    tag:stsci.edu:asdf/time/time-1.*Required

    Visit Start Time (UTC)

    The UTC time at the beginning of the visit. The time is serialized on disk as an International Organization for Standardization (ISO) 8601-compliant ISOT string, but if opened in Python with the asdf-astropy package installed, it may be read as an astropy.time.Time object with all of the associated methods and transforms available. See the documentation for astropy.time.Time objects for more information.

  • nexposures

    integerRequired

    Number of Planned Exposures

    The total number of exposures planned within the visit.

  • internal_target

    booleanRequired

    Internal Target

    A boolean indicator which, if true, indicates that the target for the visit is an internal calibration target.

Original Schema

%YAML 1.1
---
$schema: asdf://stsci.edu/datamodels/roman/schemas/rad_schema-1.0.0
id: asdf://stsci.edu/datamodels/roman/schemas/meta/visit-1.0.0

title: Visit Information
type: object
properties:
  dither:
    title: Dither Pattern Information
    type: object
    properties:
      primary_name:
        title: Primary Dither Pattern Name
        description: |
          Name of the primary dither pattern used for
          the visit.
        anyOf:
          - type: string
            maxLength: 100
          - type: "null"
        sdf:
          special_processing: VALUE_REQUIRED
          source:
            origin: PSS:dms_visit.dither_type
        archive_catalog:
          datatype: nvarchar(100)
          destination:
            [
              WFIExposure.dither_primary_name,
              SourceCatalog.dither_primary_name,
              SegmentationMap.dither_primary_name,
            ]
      subpixel_name:
        title: Subpixel Dither Pattern Name
        description: |
          Name of the subpixel dither pattern used for
          the visit.
        anyOf:
          - type: string
            maxLength: 100
          - type: "null"
        sdf:
          special_processing: VALUE_REQUIRED
          source:
            origin: PSS:dms_visit.subpixel_dither_type
        archive_catalog:
          datatype: nvarchar(100)
          destination:
            [
              WFIExposure.dither_subpixel_name,
              SourceCatalog.dither_subpixel_name,
              SegmentationMap.dither_subpixel_name,
            ]

      executed_pattern:
        title: Executed Dither Pattern Offsets (arcsec)
        description: |
          The combination of the primary and subpixel
          dither patterns (if selected) in units of arcseconds. If
          a subpixel dither pattern is selected, then all of the
          subpixel dither offsets are performed at each of the
          points in the primary dither pattern. Thus, the total
          number of dither offsets executed is the product of the
          number of points in the primary and subpixel dither
          patterns. The array contains (X, Y) pairs of offsets in
          the subpixel dither pattern where the X and Y
          coordinates are defined in the ideal system. The ideal
          coordinate system is a geomtric-distortion-corrected
          reference frame projected onto a tangent plane. For more
          information, see the Science Instrument Aperture File
          (SIAF) and associated documentation. The exposure
          identifier in meta.observation.exposure can be used to
          index this array to obtain the relative pointing offset
          from the initial target position for this exposure. Note
          that the exposure identifier is 1-indexed.
        anyOf:
          - type: array
            items:
              type: number
          - type: "null"
        sdf:
          special_processing: VALUE_REQUIRED
          source:
            origin: TBD
        archive_catalog:
          datatype: nvarchar(max)
          destination:
            [
              WFIExposure.dither_executed_pattern,
              SourceCatalog.dither_executed_pattern,
              SegmentationMap.dither_executed_pattern,
            ]
    required: [primary_name, subpixel_name, executed_pattern]

  type:
    title: Visit Type
    description: |
      The type of visit from observation planning.
    type: string
    enum:
      [
        "GENERAL_ENGINEERING",
        "GENERIC",
        "PARALLEL",
        "PRIME_TARGETED_FIXED",
        "PRIME_UNTARGETED",
      ]
    sdf:
      special_processing: VALUE_REQUIRED
      source:
        origin: PSS:dms_visit.visit_type
    archive_catalog:
      datatype: nvarchar(30)
      destination:
        [
          WFIExposure.visit_type,
          GuideWindow.visit_type,
          SourceCatalog.visit_type,
          SegmentationMap.visit_type,
        ]
  start_time:
    title: Visit Start Time (UTC)
    description: |
      The UTC time at the beginning of the visit. The time
      is serialized on disk as an International Organization for
      Standardization (ISO) 8601-compliant ISOT string, but if opened
      in Python with the asdf-astropy package installed, it may be
      read as an astropy.time.Time object with all of the associated
      methods and transforms available. See the documentation for
      astropy.time.Time objects for more information.
    tag: tag:stsci.edu:asdf/time/time-1.*
    sdf:
      special_processing: VALUE_REQUIRED
      source:
        origin: TBD
    archive_catalog:
      datatype: datetime2
      destination:
        [
          WFIExposure.visit_start_time,
          GuideWindow.visit_start_time,
          SourceCatalog.visit_start_time,
          SegmentationMap.visit_start_time,
        ]

  nexposures:
    title: Number of Planned Exposures
    description: |
      The total number of exposures planned within the
      visit.
    type: integer
    sdf:
      special_processing: VALUE_REQUIRED
      source:
        origin: PSS:dms_visit.exposures_per_dither
    archive_catalog:
      datatype: int
      destination:
        [
          WFIExposure.visit_nexposures,
          GuideWindow.visit_nexposures,
          SourceCatalog.visit_nexposures,
          SegmentationMap.visit_nexposures,
        ]
  internal_target:
    title: Internal Target
    description: |
      A boolean indicator which, if true, indicates that the
      target for the visit is an internal calibration target.
    type: boolean
    sdf:
      special_processing: VALUE_REQUIRED
      source:
        origin: PSS:dms_visit.internal_target
    archive_catalog:
      datatype: nchar(1)
      destination:
        [
          WFIExposure.visit_internal_target,
          GuideWindow.visit_internal_target,
          SourceCatalog.visit_internal_target,
          SegmentationMap.visit_internal_target,
        ]
required: [dither, type, start_time, nexposures, internal_target]